A Design Approach to Characterize Multibeam Cathode using Thermionic Emission Microscope
IR@CEERI: CSIR-Central Electronics Engineering Research Institute, Pilani
View Archive Info| Field | Value | |
| Title |
A Design Approach to Characterize Multibeam Cathode using Thermionic Emission Microscope
|
|
| Creator |
Shukla, SK
Rajoriya, N Raju, RS |
|
| Subject |
Cathodes
|
|
| Description |
Thermionic emission microscope (THEM) is an important analytical research tool for studying the electron emission uniformity of a thermionic cathode. The criticality of its design and development stems from the inhomogeneous emission nature of impregnated cathode surface. In this paper, a design approach of lens and deflection plates is described for a multibeam cathode (MBC). The design of lens is carried out using 2D TRAK and the design of deflection system using OmniTRAK 3D to ensure required deflection of beam without losing laminarity and beam interception with deflection plates. The simulation studies show that THEM could be used as an effective tool to study MBC.
|
|
| Date |
2011
|
|
| Type |
Conference or Workshop Item
PeerReviewed |
|
| Format |
application/pdf
|
|
| Identifier |
http://ceeri.csircentral.net/87/1/21_2011.pdf
Shukla, SK and Rajoriya, N and Raju, RS (2011) A Design Approach to Characterize Multibeam Cathode using Thermionic Emission Microscope. In: VEDA - 2011, November 18 - 19, 2011, Ghaziabad, India. (Submitted) |
|
| Relation |
http://ceeri.csircentral.net/87/
|
|