Charge transport and microstructure in PFO:MEH-PPV polymer blend thin films
IR@NPL: CSIR-National Physical Laboratory, New Delhi
View Archive Info| Field | Value | |
| Title |
Charge transport and microstructure in PFO:MEH-PPV polymer blend thin films
|
|
| Creator |
Bajpai, Manisha
Srivastava, Ritu Kamalasanan, M. N. Tiwari, R. S. Chand, Suresh |
|
| Subject |
Materials Science
Physics Polymer Science |
|
| Description |
Current density-voltage characteristics of poly(9,9'-dihexyl fluorenyl-2,7-diyl) (PFO) thin films (~120nm) have been studied in hole only device configuration at different temperatures (lOO-290K) in pure form and with blending (~O.2S-S0 wt%) of poly(2-methoxy-S-(2-ethylhexyloxy)-l, 4phenylenevinylene) (MEH-PPV). It has been found that in the case of pure PFO the charge transport at low fields show an ohmic region which is followed by space charge limited conduction region. Blending of PFO with MEH-PPV at low ratio (up to 2 wt%) increases the current density. As the ratio is increased further, the current density decreases. Analysis show that there is a change in conduction mechanism up to 6Vfrom SCLC to thermally activated ohmic conduction upon blending indicating the creation of new energy level near the transport states of PFO. Morphology of the polymer blended thin films was obtained by atomic force microscopy (AFM) technique. It has been found that the surface roughness of the investigated films is significantly increased upon blending indicating aggregation as well as phase separation at high blending ratios. The decrease in conductivity at high blending ratio can be related to the change in morphology of the films.
|
|
| Publisher |
Elsevier
|
|
| Date |
2010-06-09
|
|
| Type |
Article
PeerReviewed |
|
| Format |
application/pdf
|
|
| Identifier |
http://npl.csircentral.net/41/1/32.pdf
Bajpai, Manisha and Srivastava, Ritu and Kamalasanan, M. N. and Tiwari, R. S. and Chand, Suresh (2010) Charge transport and microstructure in PFO:MEH-PPV polymer blend thin films. Synthetic Metals, 160 (15-16). pp. 1740-1744. ISSN 0379-6779 |
|
| Relation |
http://www.sciencedirect.com/science/article/pii/S0379677910002456
http://npl.csircentral.net/41/ |
|